Browsing by author "Rek, Z. U."

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Influence of process-induced stress on device characteristics and its impact on scaled device performance

Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1999)
The influence of oxidation-induced stress on the generation current and its impact on scaled device performance

Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1996)