Browsing by author "Vexler, M."

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Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology

Makarov, A; Tyaginov, Stanislaw; Kaczer, Ben; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Hellings, Geert; Vexler, M.; Linten, Dimitri; Grasser, Tibor (2017)