Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology

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Authors
Makarov, A; Tyaginov, Stanislaw; Kaczer, Ben; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Hellings, Geert; Vexler, M.; Linten, Dimitri; Grasser, Tibor
Conference
IEEE International Electron Devices Meeting - IEDM
Title
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Publication type
Proceedings paper
Embargo date
9999-12-31
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