Publication:
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1943 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
1943 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations