Publication:
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1944 since deposited on 2021-10-24
Acq. date: 2026-01-26
Citations
Statistics
Views
1944 since deposited on 2021-10-24
Acq. date: 2026-01-26
Citations