Browsing by author "Kolodinski, Sabine"
Now showing items 1-8 of 8
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Characterization of ultra-thin PtSi films for infrared detectors
Bender, Hugo; Roussel, Philippe; Kolodinski, Sabine; Torres Jacome, Alfonso; Alves Donaton, Ricardo; Maex, Karen; van der Sluis, P. (1996) -
CoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime
Kolodinski, Sabine; Alves Donaton, Ricardo; Roca, Elisenda; Caymax, Matty; Maex, Karen (1995) -
Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes
Roca, Elisenda; Larsen, Kim Kyllesbech; Kolodinski, Sabine; Mertens, Robert (1995) -
Formation of CoSi2 on strained Si0.8Ge0.2 using a sacrificial Si layer
Alves Donaton, Ricardo; Kolodinski, Sabine; Caymax, Matty; Roussel, Philippe; Bender, Hugo; Brijs, Bert; Maex, Karen (1995) -
Increase in the infrared response of silicide schottky barrier diodes by grain boundary scattering
Roca, Elisenda; Kyllesbech Larsen, K.; Kolodinski, Sabine; Mertens, Robert (1995) -
Influence of grain boundary scattering in the infrared response of silicide Schottky barrier diodes
Roca, Elisenda; Larsen, Kim Kyllesbech; Kolodinski, Sabine; Mertens, Robert (1996) -
Infrared response of epitaxial and polycrystalline CoSi2 Schottky diodes
Roca, Elisenda; Larsen, Kim Kyllesbech; Kolodinski, Sabine; Mertens, Robert (1998) -
New process for controlled formation of ultra-thin PtSi films for infra-red detector applications
Torres Jacome, Alfonso; Kolodinski, Sabine; Alves Donaton, Ricardo; Maex, Karen; Roussel, Philippe; Bender, Hugo (1995)