Browsing by author "Hehenberger, Philipp"
Now showing items 1-4 of 4
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A rigorous study of measurement techniques for negative bias temperature instability
Grasser, Tibor; Wagner, Paul-Jurgen; Hehenberger, Philipp; Gos, Wolfgang; Kaczer, Ben (2007-10) -
A two-stage model for negative bias temperature instability
Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang; Aichinger, Thomas; Hehenberger, Philipp; Nelhiebel, M. (2009-04) -
Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
Hehenberger, Philipp; Aichinger, Thomas; Grasser, Tibor; Goes, Wolfgang; Triebl, O.; Kaczer, Ben; Nelhiebel, M. (2009-04) -
Quantum-mechanical modeling of NBTI in High-k SiGe MOSFETs
Hehenberger, Philipp; Goes, Wolfgang; Baumgartner, O.; Franco, Jacopo; Kaczer, Ben; Grasser, Tibor (2011)