Browsing by author "Claes, D."
Now showing items 1-2 of 2
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Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies
Franco, Jacopo; Arimura, Hiroaki; de Marneffe, Jean-Francois; Vandooren, Anne; Ragnarsson, Lars-Ake; Wu, Z.; Claes, D.; Dentoni Litta, Eugenio; Horiguchi, Naoto; Croes, Kristof; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2021) -
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Michl, J.; Grill, A.; Claes, D.; Rzepa, G.; Kaczer, B.; Linten, D.; Radu, I; Grasser, T.; Waltl, M. (2020)