Browsing by author "Farr, H."
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Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters
Ding, Youqi; Varela Pedreira, Olalla; Lofrano, Melina; Zahedmanesh, Houman; Chavez, T.; Farr, H.; De Wolf, Ingrid; Croes, Kristof (2023)