Browsing by author "Lauwagie, Tom"
Now showing items 1-4 of 4
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High throughput measurement techniques for wafer level yield inspection of MEMS devices
Varela Pedreira, Olalla; Lauwagie, Tom; De Coster, Jeroen; Haspeslagh, Luc; Witvrouw, Ann; De Wolf, Ingrid (2008) -
Highly reliable and extremely stable SiGe micro-mirrors
Gromova, Maria; Haspeslagh, Luc; Verbist, Agnes; Du Bois, Bert; Van Hoof, Rita; Eyckens, Brenda; Sijmus, Bram; De Wolf, Ingrid; Simons, Veerle; Muller, Philippe; Lauwagie, Tom; Willegems, Myriam; Locorotondo, Sabrina; Boullart, Werner; Baert, Kris; Witvrouw, Ann (2007-01) -
Resonant-based identification of the elastic properties of the layered materials: Application to air-plasma sprayed thermal barrier coatings
Lauwagie, Tom; Lambrinou, Konstantza; Patsias, Sophoclis; Heylen, Ward; Vleugels, Jozef (2008) -
Resonant-based identification of the Poisson's ratio of orthotropic materials
Lauwagie, Tom; Lambrinou, Konstantza; Sol, Hugo; Heylen, Ward (2010)