Browsing by author "Verboven, P."
Now showing items 1-5 of 5
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Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
van Dael, M.; Verboven, P.; Zanella, A.; Sijbers, Jan; Nicolai, B. (2019) -
Comparison of methods for online inspection of apple internal quality
van Dael, M.; Verboven, P.; Van Hoorebeke, L.; Sijbers, Jan; Nicolai, B. (2017) -
Electrochemical impedance spectroscopy in the presence of non-linear distortions and non-stationary behaviour Part I: Theory and validation
Van Gheem, E.; Pintelon, R.; Vereecken, J.; Schoukens, J.; Hubin, A.; Verboven, P.; Blajiev, O. (2004) -
Instantaneous impedance measurements on aluminium using a Schroeder multisine excitation signal
Van Gheem, E.; Vereecken, J.; Schoukens, J.; Pintelon, R.; Guillaume, P.; Verboven, P.; Pauwels, L. (2004) -
Multisensor X-ray inspection of internal defects in horticultural products
van Dael, M.; Verboven, P.; Dhaene, J.; Van Hoorebeke, L.; Sijbers, Jan; Nicolai, B. (2017-06)