Browsing by author "Daumann, W."

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A new consistent RF- and noise model with special emphasis on impact ionization for dual-gate HFET in cascode configuration

Breder, T.; Reuter, R.; Daumann, W.; Schreurs, Dominique; van der Zanden, Koen; Brockerhoff, W.; Tegude, F. J. (1998)