Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
A new consistent RF- and noise model with special emphasis on impact ionization for dual-gate HFET in cascode configuration
Publication:
A new consistent RF- and noise model with special emphasis on impact ionization for dual-gate HFET in cascode configuration
Date
1998
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Breder, T.
;
Reuter, R.
;
Daumann, W.
;
Schreurs, Dominique
;
van der Zanden, Koen
;
Brockerhoff, W.
;
Tegude, F. J.
Journal
Abstract
Description
Metrics
Views
1941
since deposited on 2021-09-30
Acq. date: 2025-10-27
Citations
Metrics
Views
1941
since deposited on 2021-09-30
Acq. date: 2025-10-27
Citations