Browsing by author "Werner, Thilo"
Now showing items 1-9 of 9
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28nm pitch of line/space pattern transfer into silicon substrates with chemo-epitaxy directed self-assembly (DSA) process flow
Chan, BT; Tahara, Shigeru; Parnell, Doni; Rincon Delgadillo, Paulina; Gronheid, Roel; de Marneffe, Jean-Francois; Xu, Kaidong; Nishimura, Eiichi; Werner, Thilo (2013) -
Conversion of synchronous artificial neural network to asynchronous spiking neural network using sigma-delta quantization
Yousefzadeh, A.; Hosseini, S.; Holanda, P.; Leroux, Sam; Werner, Thilo; Serrano-Gotarredona, T.; Barranco, B.L.; Dhoedt, Bart; Simoens, Pieter (2019) -
Diamond tips for automated electrical probing inside a scanning electron microscopy system
Hantschel, Thomas; Arstila, Kai; Olantera, Lauri; Schulze, Andreas; Werner, Thilo; Eyben, Pierre; Clarysse, Trudo; Vandervorst, Wilfried (2011) -
Overcoated diamond tips for nanometer-scale semiconductor device characterization
Hantschel, Thomas; Tsigkourakos, Menelaos; Kluge, Julia; Werner, Thilo; Zha, Lichen; Paredis, Kristof; Eyben, Pierre; Vandervorst, Wilfried (2014-09) -
Overcoated diamond tips for nanometer-scale semiconductor device characterization
Hantschel, Thomas; Tsigkourakos, Menelaos; Kluge, Julia; Werner, Thilo; Zha, Lichen; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Xu, Blair; Vandervorst, Wilfried (2015) -
Studying local aluminum back surface fields (AL-BSF) contacts through scanning spreading resistance microscopy (SSRM)
Uruena De Castro, Angel; John, Joachim; Eyben, Pierre; Vanhaeren, Danielle; Werner, Thilo; Hantschel, Thomas; Vandervorst, Wilfried; Poortmans, Jef; Mertens, Robert (2011) -
TiN scanning probes for electrical profiling of nanoelectronics device structures
Hantschel, Thomas; Schulze, Andreas; Celano, Umberto; Moussa, Alain; Arstila, Kai; Eyben, Pierre; Majeed, Bivragh; Sabuncuoglu Tezcan, Deniz; Werner, Thilo; Vandervorst, Wilfried (2011) -
TiN scanning probes for electrical profiling of nanoelectronics device structures
Hantschel, Thomas; Schulze, Andreas; Celano, Umberto; Moussa, Alain; Arstila, Kai; Eyben, Pierre; Majeed, Bivragh; Sabuncuoglu Tezcan, Deniz; Werner, Thilo; Vandervorst, Wilfried (2012) -
Two-dimensional analysis of Al and B back surface field using scanning
Eyben, Pierre; Werner, Thilo; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; John, Joachim; Horzel, Jörg; Vandervorst, Wilfried (2011)