Browsing by author "Haendler, S."

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Shrinking from 0.25 μm down to 0.12 μm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs

Dieudonné, F.; Haendler, S.; Jomaah, J.; Raynaud, C.; De Meyer, Kristin; van Meer, Hans; Balestra, F. (2002)