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Shrinking from 0.25 μm down to 0.12 μm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs
Publication:
Shrinking from 0.25 μm down to 0.12 μm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs
Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dieudonné, F.
;
Haendler, S.
;
Jomaah, J.
;
Raynaud, C.
;
De Meyer, Kristin
;
van Meer, Hans
;
Balestra, F.
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1902
since deposited on 2021-10-14
Acq. date: 2025-10-27
Citations
Metrics
Views
1902
since deposited on 2021-10-14
Acq. date: 2025-10-27
Citations