Browsing by author "Wang, Hui"
Now showing items 1-5 of 5
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EM-induced mass transport at the Cu/barrier interface: a new test structure for rapid assessment at user conditions
Bruynseraede, Christophe; Chiaradia, David; Wang, Hui; Maex, Karen (2003) -
Impact of current crowding on electromigration-induced mass transport
Wang, Hui; Bruynseraede, Christophe; Maex, Karen (2004) -
The influence of a structurally induced current crowding on electromigration
Wang, Hui; Bruynseraede, Christophe; Chiaradia, David; Maex, Karen (2004) -
The influence of surface fluctuations on early failures in single-damascene Cu wires: a weakest link approximation analysis
Wang, Hui; Bruynseraede, Christophe; Maex, Karen (2004) -
Ultra thin oxide reliability : effects of gate doping concentration and poly-Si.SiO2 interface stress relaxation
Wristers, D.; Wang, Hui; De Wolf, Ingrid; Han, L. K.; Kwong, D. L.; Fulford, J. (1996)