Browsing by author "Labrosse, A."
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Development of a comprehensive metrology software platform dedicated to block copolymers thin film nanopatterns
Derville, A.; Labrosse, A.; Zimmermann, Y.; Foucher, Johann; Singh, Arjun; Gronheid, Roel (2015) -
Next generation of decision making software for nanopatterns metrology: application to semiconductor industry
Dervillé, A.; Labrosse, A.; Zimmermann, Y.; Foucher, Johann; Gronheid, Roel; Boeckx, Carolien; Singh, Arjun; Leray, Philippe; Halder, Sandip (2016)