Browsing by author "Berghmans, Bart"
Now showing items 1-13 of 13
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Cesium near-surface concentration in low energy, negative mode dynamic SIMS
Berghmans, Bart; Van Daele, Benny; Geenen, Luc; Conard, Thierry; Franquet, Alexis; Vandervorst, Wilfried (2007-10) -
Cesium near-surface concentration in low energy, negative mode dynamic SIMS
Berghmans, Bart; Van Daele, Benny; Geenen, Luc; Conard, Thierry; Franquet, Alexis; Vandervorst, Wilfried (2008) -
Cesium retention during sputtering with low energy Cs+ and oxygen flooding
Berghmans, Bart; Rip, Jens; Vandervorst, Wilfried (2011-01) -
Depth resolution and surface transients in crystalline Silicon at ultra low energies
Goossens, Jozefien; Berghmans, Bart; Franquet, Alexis; Nguyen, Duy; Delmotte, Joris; Geenen, Luc; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009-09) -
Direct measurement of cesium retention for sputtering with low energy Cs+ and oxygen background flooding
Berghmans, Bart; Vandervorst, Wilfried (2009) -
Experimental studies of dose retention and activation in fin field-effect-transistor-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, R. G. R.; Vandervorst, Wilfried (2010) -
Experimental studies of dose retention and activation in FinFet-based structures
Mody, Jay; Duffy, Ray; Eyben, Pierre; Goossens, Jozefien; Moussa, Alain; Polspoel, Wouter; Berghmans, Bart; Van Dal, Mark; Pawlak, Bartek; Kaiser, Monja; Weemaes, Robbert; Vandervorst, Wilfried (2009) -
On the apparent decay length of metal at the metal-oxide/Si interface
Conard, Thierry; Vandervorst, Wilfried; Franquet, Alexis; Berghmans, Bart; Van Elshocht, Sven (2007) -
The effect of oxygen during irradiation of silicon with low energy Cs+ ions
Berghmans, Bart; Vandervorst, Wilfried (2009) -
The effect of oxygen in ULE-SIMS with Cs+ ions
Berghmans, Bart; Vandervorst, Wilfried (2008) -
The fate of the (reactive) primary ion: sputtering and desorption
Vandervorst, Wilfried; Janssens, Tom; Berghmans, Bart; Huyghebaert, Cedric (2007) -
The fate of the (reactive) primary ion: sputtering and desorption
Vandervorst, Wilfried; Janssens, Tom; Huyghebaert, Cedric; Berghmans, Bart (2008) -
Towards the ultimate depth resolution limits in SIMS
Vandervorst, Wilfried; Berghmans, Bart; Van Hove, N.; Koelling, Sebastian (2010)