Browsing by author "Selberherr, S."
Now showing items 1-3 of 3
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Electromigration-induced void evolution and failure of Cu/SiCN hybrid bonds
Ceric, H.; Zahedmanesh, Houman; Croes, Kristof; Lacerda de Orio, R.; Selberherr, S. (2023) -
Investigation of intrinsic stress effects in cantilever structures
Hollauer, Christian; Ceric, Hajdn; Van Barel, Greg; Witvrouw, Ann; Selberherr, S. (2007) -
Review-Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects
Ceric, H.; Selberherr, S.; de Orio, R. L.; Zahedmanesh, Houman; Croes, Kristof (2021)