Browsing by author "Zhang, J. C."
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Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction
Meng, D.; Zhang, J. F.; Zhang, J. C.; Zhang, W.; Ji, Z.; Benbakhti, B.; Zheng, X. F.; Hao, Y.; Vigar, D.; Adamu-Lema, F.; Chandra, V.; Aitken, R.; Kaczer, Ben; Groeseneken, Guido; Asenov, A. (2017)