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Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction
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1936 since deposited on 2021-10-24
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Acq. date: 2025-12-09
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1936 since deposited on 2021-10-24
1last month
1last week
Acq. date: 2025-12-09
Citations