Browsing by author "Sugahara, Hitoshi"
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Contour-based metrology for complex 2D shaped patterns printed by multiple-patterning process
Fuchimoto, Daisuke; Ishimoto, Toru; Hiroyuki, Shindo; Sugahara, Hitoshi; Toyoda, Yasutaka; Mailfert, Julien; De Bisschop, Peter (2014)