Browsing by author "Vexler, M. I."
Now showing items 1-2 of 2
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Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Makarov, A.; Tyaginov, S. E.; Kaczer, Ben; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Hellings, Geert; Vexler, M. I.; Linten, Dimitri; Grasser, T. (2017) -
On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective
Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Z.; Makarov, Alexander; De Keersgieter, An; Vexler, M. I.; Vandemaele, Michiel; Wang, R.; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben (2023)