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Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
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2000 since deposited on 2021-10-24
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Acq. date: 2025-10-25
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Views
2000 since deposited on 2021-10-24
420item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations