Publication:
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
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2009 since deposited on 2021-10-24
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Acq. date: 2026-09-11
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Statistics
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2009 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-09-11
Citations