Publication:

Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology

Date

2017

Proceedings Paper

Simple item page Full metadata Statistics

Files

37882.pdf 2.07 MB

Author(s)

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Tyaginov, S. E.

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Vaisman Chasin, Adrian

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Hellings, Geert

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Linten, Dimitri

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Metrics

2003 since deposited on 2021-10-24

1last month

Acq. date: 2025-12-11