Browsing by author "Fukutome, H."
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High resolution electrical characterization of advanced CMOS devices
Eyben, Pierre; Petry, Jasmine; Janssens, Tom; Fukutome, H.; Vandervorst, Wilfried (2004) -
High resolution two-dimensional carrier profiling on sub-100nm silicon nano-devices using scanning spreading resistance microscopy
Eyben, Pierre; Fukutome, H.; Alvarez, David; Vandervorst, Wilfried (2004)