Publication:
High resolution two-dimensional carrier profiling on sub-100nm silicon nano-devices using scanning spreading resistance microscopy
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1882 since deposited on 2021-10-15
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Acq. date: 2025-10-24
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Views
1882 since deposited on 2021-10-15
419item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations