Browsing by author "Asanovski, R."
Now showing items 1-2 of 2
-
Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
Asanovski, R.; Arimura, Hiroaki; de Marneffe, Jean-Francois; Palestri, P.; Horiguchi, Naoto; Kaczer, Ben; Selmi, L.; Franco, Jacopo (2024) -
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Asanovski, R.; Grill, Alexander; Franco, Jacopo; Palestri, P.; Beckers, Arnout; Kaczer, Ben; Selmi, L. (2022)