Browsing by author "O'Neill, A.G"
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Insight into the aggravated lifetime reliability in advanced MOSFETs with strained Si channels on SiGe strain relaxed buffers due to self-heating
Agaiby, R.; O'Neill, A.G; Olsen, S.H; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor (2008)