Browsing by author "Lalor, M."
Now showing items 1-6 of 6
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Dependence of energy distributions of interface states on stress conditions
Zhang, Wenqi; Zhang, Jenny; Uren, M. J.; Groeseneken, Guido; Degraeve, Robin; Lalor, M.; Burton, D. (2001) -
Electron trap generation at different temperatures in the gate oxide
Zhang, W.D.; Zhang, J.F.; Wood, M.; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2002) -
On the interface states generated under different stress conditions
Zhang, Wenqi; Zhang, Jenny; Uren, M. J.; Groeseneken, Guido; Degraeve, Robin; Lalor, M.; Burton, D. (2001) -
On the mechanism of electron trap generation in gate oxides
Zhang, Wenqi; Zhang, Jenny; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2001) -
Properties of electron traps generated in the gate oxide
Zhang, Wenqi; Zhang, Jenny; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2001) -
Two types of electron traps generated in the gate silicon dioxide
Zhang, W.D.; Zhang, J.F.; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2002)