Publication:

Electron trap generation at different temperatures in the gate oxide

Date

2002

Presentation

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Author(s)

Zhang, W.D.

;

Zhang, J.F.

;

Wood, M.

;

Lalor, M.

;

Burton, D.

;

Groeseneken, Guido

;

Degraeve, Robin

Statistics

1952 since deposited on 2021-10-15

Acq. date: 2026-09-18