Browsing by author "Bisiaux, Pierre"
Now showing items 1-4 of 4
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Application of FFT-scanning spreading resistance microscopy to the analysis of poly-silicon solar-cells
Eyben, Pierre; Bisiaux, Pierre; Schulze, Andreas; Vandervorst, Wilfried (2014) -
Development and evaluation of the Fast Fourier Transform-SSRM technique
Eyben, Pierre; Bisiaux, Pierre; Vandervorst, Wilfried (2014) -
Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques
Eyben, Pierre; Bisiaux, Pierre; Schulze, Andreas; Nazir, Aftab; Vandervorst, Wilfried (2015) -
Increasing the performances of the SSRM technique introducing the FFT-SSRM mode
Eyben, Pierre; Bisiaux, Pierre; Vandervorst, Wilfried (2014)