Browsing by author "Routoure, J.M."
Now showing items 1-13 of 13
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DC and noise performances of SOI FinFETs at very low temperature
Achour, H.; Talmat, R.; Cretu, B.; Routoure, J.M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2012) -
Identification de niveaux pièges dans les oxydes de transistors MOS par des mesures de bruit basse-fréquence à différentes températures
Routoure, J.M.; Guo, W.; Cretu, B.; Lartigau, I.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2008) -
Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy
Achour, H.; Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Benfdila, A.; Aoulaiche, Marc; Claeys, Cor (2015) -
Low frequency noise spectroscopy in advanced nFinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2011) -
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors
Lartigau, I.; Routoure, J.M.; Guo, W.; Cretu, B.; Carin, R.; Mercha, Abdelkarim; Claeys, Cor; Simoen, Eddy (2007) -
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator MOSFETs
Lartigau, I.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2003) -
Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
Guo, Wei; Nicholas, Gareth; Kaczer, Ben; Todi, Ravi; De Jaeger, Brice; Claeys, Cor; Mercha, Abdelkarim; Simoen, Eddy; Cretu, B.; Routoure, J.M.; Carin, R. (2007) -
Low-frequency noise behavior at low temperature (80K-300K) of silicon passivated Ge pMOSFETs with high-K metal gate stack
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Guo, W.; Talmat, R.; Cretu, B.; Routoure, J.M.; Carin, R.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2009) -
Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities
Simoen, Eddy; Aoulaiche, Marc; dos Santos, Sara; Martino, Joao; Strobel, Vincent; Cretu, Bogdan; Routoure, J.M.; Carin, Regis; Luque Rodriguez, Abraham; Jimenez Tejada, Juan Antonio; Claeys, Cor (2013) -
Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs
Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Aoulaiche, Marc; Claeys, Cor (2015) -
Temperature impact on the Lorentzian noise induced by electron valence-band tunneling in partially depleted SOI p-MOSFETs
Guo, W.; Cretu, B.; Routoure, J.M.; Carin, R.; Simoen, Eddy; Claeys, Cor (2007) -
Unusual noise behavior versus temperature in nFinFETs on silicon on insulator (SOI) substrates processed with different strain techniques
Guo, Wei; Routoure, J.M.; Cretu, B.; Carin, R.; Simoen, Eddy; Mercha, Abdelkarim; Collaert, Nadine; Put, Sofie; Claeys, Cor (2008)