Publication:
Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack
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1952 since deposited on 2021-10-16
Acq. date: 2025-10-23
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1952 since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations