Authors

Guo, Wei; Nicholas, Gareth; Kaczer, Ben; Todi, Ravi; De Jaeger, Brice; Claeys, Cor; Mercha, Abdelkarim; Simoen, Eddy; Cretu, B.; Routoure, J.M.; Carin, R.

Issue

4

Journal

IEEE Electron Device Letters

Volume

28

Title

Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stack

Publication type

Journal article