Browsing by author "Reimbold, G."

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A new method for quickly evaluating reversible and permanent components of the BTI degradation

Garros, X.; Subirats, Alexandre; Reimbold, G.; Gaillard, F.; Diouf, C.; Federspiel, X.; Huard, V.; Rafik, M. (2018)
Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

Marchand, B.; Cretu, B.; Ghibaudo, G.; Balestra, F.; Blachier, D.; Leroux, C.; Deleonibus, S.; Guegan, G.; Reimbold, G.; Kubicek, Stefan; De Meyer, Kristin (2002)