Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

Marchand, B.; Cretu, B.; Ghibaudo, G.; Balestra, F.; Blachier, D.; Leroux, C.; Deleonibus, S.; Guegan, G.; Reimbold, G.; Kubicek, Stefan; De Meyer, Kristin

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Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

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2002

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Solid-State Electronics

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Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

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