Authors

Marchand, B.; Cretu, B.; Ghibaudo, G.; Balestra, F.; Blachier, D.; Leroux, C.; Deleonibus, S.; Guegan, G.; Reimbold, G.; Kubicek, Stefan; De Meyer, Kristin

Issue

3

Journal

Solid-State Electronics

Volume

46

Title

Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

Publication type

Journal article

Embargo date

9999-12-31