Publication:

Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures

Date

2002
Journal article
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Author(s)

Marchand, B.
;
Cretu, B.
;
Ghibaudo, G.
;
Balestra, F.
;
Blachier, D.
;
Leroux, C.
;
Deleonibus, S.
;
Guegan, G.
;
Reimbold, G.
;
Kubicek, Stefan  
;
De Meyer, Kristin  

Journal

Solid-State Electronics

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