Browsing by author "Saraswat, K. C."
Now showing items 1-3 of 3
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Influence of process-induced stress on device characteristics and its impact on scaled device performance
Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1999) -
The influence of oxidation-induced stress on the generation current and its impact on scaled device performance
Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1996) -
Towards high mobility GeSn channel nMOSFETs: improved surface passivation using novel ozone oxidation method
Gupta, Somya; Vincent, Benjamin; Yang, B.; Lin, Dennis; Gencarelli, Federica; Lin, J.-Y. J.; Chen, R.; Richard, Olivier; Bender, Hugo; Magyari-Koepe, B.; Caymax, Matty; Dekoster, Johan; Nishi, Y.; Saraswat, K. C. (2012)