Browsing by author "Nishiyama, K."
Now showing items 1-3 of 3
-
Degradation behaviors for high temperature irradiated NPN Si transistors
Ohyama, H.; Takakura, K.; Nishiyama, K.; Simoen, Eddy; Claeys, Cor (2002) -
Effects of electron irradiation on SiC Schottky diodes
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Nakabayashi, M.; David, Marie-Laure; Simoen, Eddy; Claeys, Cor (2004) -
Radiaton damage of SiC Schotttky diodes by electron irradiation
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Shigaki, K.; Kudou, T.; Nakabayashi, M.; Kuboyama, S.; Matsuda, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor (2005)