Browsing by author "Olsson, J."
Now showing items 1-2 of 2
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Metal gate work function extraction using Fowler-Nordheim tunneling techniques
Sjöblom, G.; Pantisano, Luigi; Schram, Tom; Olsson, J.; Afanas'ev, V.; Heyns, Marc (2005) -
On the thermal stability of atomic layer deposited TiN as gate electrode in MOS devices
Westlinder, J.; Schram, Tom; Pantisano, Luigi; Cartier, Eduard; Kerber, Andreas; Lujan, Guilherme; Olsson, J.; Groeseneken, Guido (2003)