Browsing by author "Boutsen, J."
Now showing items 1-4 of 4
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Lifetime modeling of intrinsic gate oxide breakdown at high temperature
Moonen, R.; Vanmeerbeek, P.; Lekens, Geert; De Ceuninck, Ward; Moens, P.; Boutsen, J. (2007) -
Molecular imprinted polymer films on RFID tags - a first step toward disposable packaging ssensors
Croux, Dieter; Vangerven, Tim; Broeders, Jeroen; Boutsen, J.; Peeters, Marloes; Duchateau, Stijn; Deferme, Wim; Cleij, Thomas; Wagner, Patrick; Thoelen, Ronald; De Ceuninck, Ward (2013) -
Molecular imprinted polymer films on RFID tags: a first step towards disposable packaging sensors
Croux, Dieter; Vangerven, Tim; Broeders, Jeroen; Boutsen, J.; Peeters, Marloes; Duchateau, Stijn; De Ceuninck, Ward (2013) -
Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
Moonen, R.; Vanmeerbeek, P.; Lekens, Geert; De Ceuninck, Ward; Moens, P.; Boutsen, J. (2007)