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Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
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2 since deposited on 2021-10-16
Acq. date: 2026-01-08
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1937 since deposited on 2021-10-16
Acq. date: 2026-01-08
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2 since deposited on 2021-10-16
Acq. date: 2026-01-08
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1937 since deposited on 2021-10-16
Acq. date: 2026-01-08
Citations