Browsing by author "Takami., Y."

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Radiation damage of N-MOSFETS fabricated in a BiCMOS process

Kobayashi, K.; Ohyama, Hidenori; Yoneoka, M.; Hayama, Kiyoteru; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami., Y.; Takizawa, H.; Kohiki, S. (2001)