Browsing by author "Luo, Xuyi"
Now showing items 1-4 of 4
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Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
Li, Kan; Luo, Xuyi; Rony, M. W.; Gorchichko, Mariia; Hiblot, Gaspard; Van Huylenbroeck, Stefaan; Jourdain, Anne; Alles, Michael L.; Reed, Robert A.; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2023) -
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
Luo, Xuyi; Zhang, En Xia; Wang, Peng Fei; Li, Kan; Linten, Dimitri; Mitard, Jerome; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2023) -
Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
Rony, M. W.; Zhang, En Xia; Toguchi, Shintaro; Luo, Xuyi; Reaz, Mahmud; Li, Kan; Linten, Dimitri; Mitard, Jerome; Reed, Robert A.; Fleetwood, Daniel M.; Schrimpf, Ronald D. (2022) -
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
Guo, Zixiang; Li, Kan; Li, Xun; Luo, Xuyi; Zhang, En Xia; Reed, Robert A.; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Vaisman Chasin, Adrian; Mitard, Jerome; Linten, Dimitri (2023)