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Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
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Authors
Luo, Xuyi
;
Zhang, En Xia
;
Wang, Peng Fei
;
Li, Kan
;
Linten, Dimitri
;
Mitard, Jerome
;
Reed, Robert A.
;
Fleetwood, Daniel M.
;
Schrimpf, Ronald D.
DOI
10.1109/TDMR.2023.3240976
ISSN
1530-4388
Issue
1
Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume
23
Title
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
Publication type
Journal article
Embargo date
9999-12-31
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2
20.500.12860/41575.2
*
2023-07-03T11:55:09Z
validation by library/open access desk
1
20.500.12860/41575
2023-05-07T20:59:46Z
*Selected version
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