Publication:

Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

Date

2023

Journal article

https://doi.org/10.1109/TDMR.2023.3240976

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Files

Published version 5.48 MB

Author(s)

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Linten, Dimitri

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Reed, Robert A.

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Fleetwood, Daniel M.

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Schrimpf, Ronald D.

Journal

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Metrics

1271 since deposited on 2023-05-07

Acq. date: 2025-12-09