Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

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Published version 5.48 MB

Author(s)

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Linten, Dimitri

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Reed, Robert A.

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Fleetwood, Daniel M.

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Schrimpf, Ronald D.

Journal

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Metrics

1270 since deposited on 2023-05-07

Acq. date: 2025-10-23