dc.contributor.author | Luo, Xuyi | |
dc.contributor.author | Zhang, En Xia | |
dc.contributor.author | Wang, Peng Fei | |
dc.contributor.author | Li, Kan | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Reed, Robert A. | |
dc.contributor.author | Fleetwood, Daniel M. | |
dc.contributor.author | Schrimpf, Ronald D. | |
dc.date.accessioned | 2023-07-03T11:56:57Z | |
dc.date.available | 2023-05-07T20:59:46Z | |
dc.date.available | 2023-07-03T11:56:57Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1530-4388 | |
dc.identifier.other | WOS:000967483600019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41575.2 | |
dc.source | WOS | |
dc.title | Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/TDMR.2023.3240976 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 153 | |
dc.source.endpage | 161 | |
dc.source.journal | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | |
dc.source.issue | 1 | |
dc.source.volume | 23 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This work was supported in part by the U.S.Air Force under Award FA9550-22-1-0012 and Award FA9550-17-1-0046. | |