Browsing by author "Johnsson, David"
Now showing items 1-2 of 2
-
Impact of tester source impedance on HBM failure level
Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Johnsson, David; Groeseneken, Guido (2012) -
Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester
Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Johnsson, David; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vandersteen, Gerd; Sawada, Masanori; Groeseneken, Guido (2012)