Browsing by author "Frickinger, J."
Now showing items 1-2 of 2
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Approach for a standardized methodology for multisite processing of 300-mm wafers at R&D sites
Oechsner, Richard; Pfeffer, M.; Frickinger, J.; Schellenberger, M.; Roeder, G.; Pfitzner, L.; Ryssel, H.; Fritzsche, M.; Kaushik, V.; Renaud, D.; Danel, A.; Claeys, Cor; Bearda, Twan; Lering, M.; Graef, M.; Murphy, B.; Walther, H.; Hury, S. (2007) -
Management of metallic contamination in advanced IC manufacturing
Besson, P.; Bigot, C.; Grouillet, A.; Joly, J.P.; Claes, Martine; Bearda, Twan; Frickinger, J. (2005)